TID in-situ measurement of temperature coefficient of various commercial voltage references

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124955" target="_blank" >RIV/00216305:26220/17:PU124955 - isvavai.cz</a>
Result on the web
<a href="https://ieeexplore.ieee.org/document/8093206" target="_blank" >https://ieeexplore.ieee.org/document/8093206</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/RADECS.2017.8696249" target="_blank" >10.1109/RADECS.2017.8696249</a>

Result language
angličtina
Original language name
TID in-situ measurement of temperature coefficient of various commercial voltage references
Original language description
this work presents results of a total ionising dose experiment, during which commercial voltage references were irradiated and measured under different bias conditions using an in-situ technique. The automated test system allowed the output voltage of the voltage references to be measured at various temperatures during irradiation to 100 krad(Si) and the subsequent 7 day period of annealing.The experimental results obtained allow improved insight into total ionising dose induced degradation of data acquisition systems for space applications. The results show that the temperature coefficient of selected commercial voltage references significantly changes (increases) with TID. Therefore these devices can be used for data acquisition systems only on board LEO missions like CubeSats, which are typically exposed to a limited radiation dose.
Czech name
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Czech description
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Project
<a href="/en/project/LO1401" target="_blank" >LO1401: Interdisciplinary Research of Wireless Technologies</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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