Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU126751" target="_blank" >RIV/00216305:26220/18:PU126751 - isvavai.cz</a>

Result on the web

<a href="https://www.sciencedirect.com/science/article/pii/S0924424717318885" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0924424717318885</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.sna.2018.01.014" target="_blank" >10.1016/j.sna.2018.01.014</a>

Result language

angličtina

Original language name

Single Measurement Determination of Mechanical, Electrical, and Surface Properties of a Single Carbon Nanotube via Force Microscopy

Original language description

Carbon nanotubes (CNTs) have attracted significant attention due to their remarkable mechanical and electrical properties. Although it is assumed that the most important questions about CNTs have been addressed, the opposite is true. CNTs have high mechanical stiffness and electrical conductivity and, due to their small diameter and size, the measurement of those properties at nanoscale level is challenging. Here, we present a unique method to determine their mechanical and electrical properties by using interactions between vertically aligned multiwall CNTs and a metal-coated tipless atomic force microscope cantilever. We used a force–distance measurement (FDM) method with concurrent monitoring of electrical current. We could identify the number of CNTs in contact with the cantilever, stiffness of each individual CNT, the adhesion force between the cantilever and individual CNTs, and the electrical conductivity of each CNT. The method is also suitable for characterizing other vertically aligned nanostructured materials, such as nanowires. This method addresses the long-standing problem of property determination of materials such as CNTs and nanowires and is an important addition to the toolbox of nanoscale characterization methods.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Sensors and Actuators

ISSN

0924-4247

e-ISSN

—

Volume of the periodical

271

Issue of the periodical within the volume

NA

Country of publishing house

CH - SWITZERLAND

Number of pages

6

Pages from-to

217-222

UT code for WoS article

000426331800029

EID of the result in the Scopus database

2-s2.0-85041462045