Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F02%3APU36249" target="_blank" >RIV/00216305:26230/02:PU36249 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level
Original language description
In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which aresub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area ooverhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F01%2F1531" target="_blank" >GA102/01/1531: Formal approaches in digital circuit diagnostics - testable design verification</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
ISBN
0-7695-1790-0
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
166-173
Publisher name
IEEE Computer Society Press
Place of publication
Los Alamitos
Event location
Dortmund
Event date
Sep 4, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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