Formal and Analytical Approaches to the Testability Analysis - the Comparison

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F01%3APU28680" target="_blank" >RIV/00216305:26220/01:PU28680 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Formal and Analytical Approaches to the Testability Analysis - the Comparison
Original language description
The paper deals with two approaches to the RTL testability analysis - formal and analytical ones and their results. The formal approach is based on the theory of set and the predicate logic concepts and algorithms, while the analytical approach applies controllability/observability metrics as a population for genetic algorithm procedures. The reasons for RTL testability analysis are described together with possible solutions. The goal of both methodologies is to utilise the data paths existing in the inn the UUA (Unit Under Analysis) to reduce necessary modifications and recommend registers for scan. Possible modifications are discussed from the area overhead point of view.
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F01%2F1531" target="_blank" >GA102/01/1531: Formal approaches in digital circuit diagnostics - testable design verification</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop 2001
ISBN
963-7175-16-4
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
123-128
Publisher name
SZIF-UNIVERSITAS Ltd., Hungary
Place of publication
Gyor
Event location
Gyor
Event date
Apr 18, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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