All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

NAND/NOR Gate Polymorphism in Low Temperature Environment

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F12%3APU98219" target="_blank" >RIV/00216305:26230/12:PU98219 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    NAND/NOR Gate Polymorphism in Low Temperature Environment

  • Original language description

    The fundamental aspect behind this paper is focused on behaviour of polymorphic digital circuits in potentially harsh operating environment. Unlike conventional CMOS-based circuits, the area of polymorphic electronics takes and an advantage of inherentlybuilt-in features that open up the possibility for on-the-fly adjustment of a particular circuit function with respect to the surrounding environment. The most prevalent benefit here is connected with the fact that space-efficient circuit implementationcan be achieved due to the adoption of polymorphic principles and, thus, eliminate the need for an additional function change controller. From a conceptual point of view, key attention is given to a set of experiments which were conducted with the aim to evaluate the influence of wide temperature range (with special interest in low temperatures domain) in case of reconfigurable chip with dedicated polymorphic gates. The experimental setup was based around reconfigurable polymorphic chip

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

  • ISBN

    978-1-4673-1185-4

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    34-37

  • Publisher name

    Institute of Electrical and Electronics Engineers

  • Place of publication

    Tallinn

  • Event location

    Tallinn

  • Event date

    Apr 18, 2012

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article