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VerTrace: An Open-Source Toolchain for Portable Stimulus Vertical Reuse

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26230%2F26%3A0198105" target="_blank" >RIV/00216305:26230/26:0198105 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/11270614" target="_blank" >https://ieeexplore.ieee.org/document/11270614</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ICECS66544.2025.11270614" target="_blank" >10.1109/ICECS66544.2025.11270614</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    VerTrace: An Open-Source Toolchain for Portable Stimulus Vertical Reuse

  • Original language description

    The Portable Test and Stimulus Standard (PSS) is a new standard used in the verification of hardware designs. It enables the reuse of abstract verification scenarios across platforms, design variants, and design hierarchies through portable models (PMs). The standard and use cases presented in the publications primarily focus on scenario creation and constraint solving within PMs, while the infrastructure for transforming abstract scenarios into executable tests remains largely manual. This paper presents VerTrace, a unique toolchain for automating the vertical reuse of PMs, developed by extending and adapting existing open-source tools and by developing custom tools. The toolchain was evaluated on several open-source RTL designs of varying complexity. Results demonstrate that the toolchain scales effectively with design complexity and transforms PSS vertical reuse from a manual, error-prone process into an automated approach grounded in static design analysis.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20206 - Computer hardware and architecture

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2025

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)

  • ISBN

    979-8-3315-9585-2

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    1-4

  • Publisher name

    IEEE

  • Place of publication

    Marrakech, Morocco

  • Event location

    Marrakech

  • Event date

    Nov 17, 2025

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article