Surface and bulk scattering in microcrystalline silicon for solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F00%3APU20289" target="_blank" >RIV/00216305:26310/00:PU20289 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Surface and bulk scattering in microcrystalline silicon for solar cells
Original language description
We present here an overview of the light scattering influence on absorption coefficient spectra alpha(E) measured by constant photocurrent method (CPM) and/or by photothermal deflection spectroscopy (PDS). We compare results of numerical simulation withthe measured CPM and PDS spectra and verify our theory by polishing the as-grown nanotextured layes. We show that the experimentally observed apparent absorption coefficient can oveestimate the true alpha(E) by a factor 10.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
<a href="/en/project/GA102%2F96%2F0105" target="_blank" >GA102/96/0105: Thin film field effect transistor based on organic substances</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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