Simple Method for the Determination of the Type of Charge Carriers in Semiconductors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26310%2F16%3APU115240" target="_blank" >RIV/00216305:26310/16:PU115240 - isvavai.cz</a>
Result on the web
<a href="https://www.scientific.net/MSF.851.179" target="_blank" >https://www.scientific.net/MSF.851.179</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.4028/www.scientific.net/MSF.851.179" target="_blank" >10.4028/www.scientific.net/MSF.851.179</a>
Alternative languages
Result language
angličtina
Original language name
Simple Method for the Determination of the Type of Charge Carriers in Semiconductors
Original language description
The source-drain current-voltage characteristic is linear and symmetric at low voltages. The linearity and symmetry can be influenced by the electric potential of a gate electrode. Because the process is sensitive to the type of semiconductor, the method – “modified field effect transistor method” – can be used for the determination of the type of majority charge carriers. No insulating layer between the source-drain and gate electrodes is used. The effect is demonstrated on P- and N type organic semiconductors, 6-bis[5-(benzofuran-2-yl)-thiofen-2-yl]-2,5-bis(2-ethylhexyl) pyrrolo[3,4-c]pyrrole-1,4-dione [DPP(TBFu)2] and phenyl-C61-butyric acid methyl ester [PCBM], respectively.
Czech name
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Czech description
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Classification
Type
J<sub>SC</sub> - Article in a specialist periodical, which is included in the SCOPUS database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials Science Forum
ISSN
0255-5476
e-ISSN
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Volume of the periodical
851
Issue of the periodical within the volume
4
Country of publishing house
CH - SWITZERLAND
Number of pages
5
Pages from-to
179-183
UT code for WoS article
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EID of the result in the Scopus database
2-s2.0-84978983297