Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F18%3APU136355" target="_blank" >RIV/00216305:26620/18:PU136355 - isvavai.cz</a>
Alternative codes found
RIV/00177016:_____/18:N0000062
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison
Original language description
We first assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for the simultaneous identification of the local thermal conductivity and phase transition temperature of polymeric materials. In a second step, results of an interlaboratory comparison and an uncertainty analysis involving three laboratories applying the same protocol of phase transition temperature measurement allow evaluating the repeatability, the reproducibility and the reliability of the method.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC)
ISBN
978-1-5386-6759-0
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
1-6
Publisher name
Neuveden
Place of publication
Neuveden
Event location
Stockholm
Event date
Sep 26, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000467096000036

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