CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F19%3APU131919" target="_blank" >RIV/00216305:26620/19:PU131919 - isvavai.cz</a>
Result on the web
<a href="https://www.ndt.net/search/docs.php3?showForm=off&id=23697" target="_blank" >https://www.ndt.net/search/docs.php3?showForm=off&id=23697</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
CCD and scientific-CMOS detectors for submicron laboratory based X-ray Computed Tomography
Original language description
The key component of any CT (X-ray computed tomography) machine is a detection system. In area of scientific CT imaging applications three types of sensors are mainly used. These are amorphous silicon (α-Si) flat panels, complementary metal–oxide–semiconductor (CMOS) and charge-coupled device (CCD) sensors. Here the performance and comparison study of the two lastly named sensor types is conducted in field of high resolution CT imaging. CCD and novel sCMOS-based (scientific CMOS) detection systems are tested using high-resolution laboratory-based Rigaku nano3DX system (ability to achieve submicron voxel resolution). Properties of each camera were evaluated as well as the quality and noise properties of acquired data (both projectionand CT data).
Czech name
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Czech description
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Type
J<sub>ost</sub> - Miscellaneous article in a specialist periodical
CEP classification
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OECD FORD branch
20305 - Nuclear related engineering; (nuclear physics to be 1.3);

Project
<a href="/en/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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