Cycle life and degradation sources in Li-S cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F19%3APU133718" target="_blank" >RIV/00216305:26620/19:PU133718 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Cycle life and degradation sources in Li-S cells
Original language description
The degradation of Lithium-Sulphur cell structure within the charge-discharge cycling limits the lifetime of these devices. The sources of degradation are determined as (i) the change of electrode effective area, (ii) the decrease of electrolyte conductivity and (iii) the degradation of the potential barriers existing on the electrode/electrolyte interface. The mechanisms responsible for the Li-S structure degradation were indicated as the decrease of Sulphur quantity in the vicinity of carbon electrode available for the electrochemical reactions, and the thermal degradation of the electrolyte resulting from the temperature increase due to the cell cycling. Cycle life is influenced by the end-of-charge voltage (EOCV), end-of-discharge voltage (EODV) as well as by the charge-discharge current rate. The degradation of Li-S cell is accelerated by including the relaxation between the cell charge and discharge, i.e. keeping the cell in the charged state.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Technical Digest of 13th Conference „Electron Technology” ELTE and 43rd International Microelectronics and Packaging IMAPS Poland Conference
ISBN
978-83-932464-3-4
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
83-84
Publisher name
International Microelectronics and Packaging Society Poland Chapter
Place of publication
Kraków, Poland
Event location
Wroclaw
Event date
Sep 4, 2019
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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