Investigating the thickness-effect of free-standing high aspect-ratio TiO2 nanotube layers on microwave-photoresponse using planar microwave resonators
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F23%3APU148456" target="_blank" >RIV/00216305:26620/23:PU148456 - isvavai.cz</a>
Alternative codes found
RIV/00216275:25310/23:39920434
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S2352940723001026" target="_blank" >https://www.sciencedirect.com/science/article/pii/S2352940723001026</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apmt.2023.101832" target="_blank" >10.1016/j.apmt.2023.101832</a>
Alternative languages
Result language
angličtina
Original language name
Investigating the thickness-effect of free-standing high aspect-ratio TiO2 nanotube layers on microwave-photoresponse using planar microwave resonators
Original language description
One-dimensional TiO2 nanotube (TNT) layers are a promising candidate for UV detection due to their distinctive anisotropic geometry which is effective for light harvesting and rapid carrier transport. Here, the photosensitivity efficiency of TNT layers with various thicknesses of 15, 50, 80, and 110 mu m was utilized at a microwave frequency regime by modeling and experimentally. A planar microwave split ring resonator (PMSRR) was designed and fabricated to operate at -8 GHz to study TNT layers by monitoring the scattering parameter (S21) of the PMSRR under a constant UV irradiation power of -96.4 mu W/cm2. According to the results, the 80 mu m thick TNT layers demonstrated the highest resonant amplitude variation for the customized PMSRR. The change of the resonant amplitude was mainly attributed to the conductivity variation contributed by perturbation of trapped electron concentration, as the dominant factor under UV illumination, and their electromagnetic wave interaction. The main advantage of the proposed method of PMSRR for microwave photosensitivity monitoring over the conventional direct current (DC) conductivity measurements is to eliminate the effect of contact resistance between the TNT layers and metal electrodes utilizing the contactless aspect of wave interactions with the TNT layers at microwave regime to perform electrode-less measurements.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20500 - Materials engineering
Result continuities
Project
<a href="/en/project/EF17_048%2F0007421" target="_blank" >EF17_048/0007421: Strengthening interdisciplinary cooperation in research of nanomaterials and their effects on living organisms (NANOBIO)</a><br>
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Materials Today
ISSN
2352-9407
e-ISSN
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Volume of the periodical
32
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
10
Pages from-to
1-10
UT code for WoS article
000991219100001
EID of the result in the Scopus database
2-s2.0-85153801470