A practical guide to interpreting low energy ion scattering (LEIS) spectra

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU151287" target="_blank" >RIV/00216305:26620/24:PU151287 - isvavai.cz</a>

Result on the web

<a href="https://doi.org/10.1016/j.apsusc.2023.158793" target="_blank" >https://doi.org/10.1016/j.apsusc.2023.158793</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2023.158793" target="_blank" >10.1016/j.apsusc.2023.158793</a>

Result language

angličtina

Original language name

A practical guide to interpreting low energy ion scattering (LEIS) spectra

Original language description

Low-Energy Ion Scattering (LEIS) spectrometry is extraordinarily sensitive and specific to the outermost atomic layers of materials. It is a powerful tool for surface science. Here, we present a practical guide on LEIS spectral interpretation that is based on actual LEIS spectra of a variety of materials. While this article covers some of the theory of LEIS, it is not an exhaustive description of this aspect of the technique. Rather, it is intended for the broad community of scientists who, while not necessarily active users of LEIS instruments, need LEIS in their research, perhaps obtaining LEIS spectra by collaboration or encountering it in the scientific literature. The spectra/experimental results we present reflect both basic and advanced features of LEIS. We believe this guide is quite comprehensive. Most of the spectra shown herein were obtained on a modern high sensitivity (HS)-LEIS instrument. The analyser of this instrument defines and fixes a scattering angle of 145 degrees. However, these results are representative of other widely used geometries. The features of these spectra are quite general. Key concepts covered in this work include surface peaks, elements that promote reionization, double and multiple scattering/ collisions, quantification with reference materials, the effect of contamination, differences between particulate and crystalline materials/surfaces, direct scattering from the second atomic layer of a material, and the use and effects of different primary ions, e.g., He+, Ne+, and Ar+. The LEIS spectra shown and discussed in this work come from different materials, including as-received, clean, and oxidized Cu, silicone rubber, Ca evaporated onto SiO2, Al, graphene on Cu, Fe, Rh, FeRh, CaF2, native silicon oxide (SiO2) on silicon, BeO, B2O3, Bi2Se3, Teflon (polytetrafluoroethylene), LiF, SrTiO3, an alloy with five elements (Cr, Mn, Fe, Co and Ni), and Au. Many of these materials are of substantial technological interest.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10400 - Chemical sciences

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Surface Science

ISSN

0169-4332

e-ISSN

1873-5584

Volume of the periodical

657

Issue of the periodical within the volume

1

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

20

Pages from-to

„“-„“

UT code for WoS article

001208543100001

EID of the result in the Scopus database

2-s2.0-85181033709