Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F24%3APU152327" target="_blank" >RIV/00216305:26620/24:PU152327 - isvavai.cz</a>

Alternative codes found

RIV/68081723:_____/24:00597951 RIV/68081731:_____/24:00597917

Result on the web

<a href="https://sciendo.com/article/10.2478/jee-2024-0033" target="_blank" >https://sciendo.com/article/10.2478/jee-2024-0033</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.2478/jee-2024-0033" target="_blank" >10.2478/jee-2024-0033</a>

Result language

angličtina

Original language name

Comparative analysis of surface layer functionality in STM and AFM probes: Effects of coating on emission characteristics

Original language description

This study compares different types of scanning probe microscopy (SPM) probes according to the function of the surface layer at the tip apex. Three main types of SPM probes were analyzed: scanning tunneling microscopy (STM) tungsten probes, conductive atomic force microscopy (AFM) probes, and non-conductive AFM probes. The tungsten STM probes were coated with a graphite layer to simulate the effects of carbonization. The tested AFM probes were specifically NenoProbe conductive AFM probes (platinum-coated tip) and Akiyama non-conductive AFM probes coated with gold. The gold coating is intended to improve surface conductivity and help achieve a homogeneous, oxidation-resistant surface. The three samples were measured in a field emission microscope to study their current-voltage characteristics. The obtained current-voltage characteristics were tested and analyzed by the Forbes field emission orthodoxy test, providing the field emission parameters that correlate with the state of the scanning probe tip. In this study, the most important parameter is the formal emission area parameter, which indicates the formal tunneling current density through the probe tip-sample nanogap. For an STM tip, this reflects the size and shape of the region from which electrons tunnel to the sample surface. If this area is larger than expected or desired, it may indicate problems with tip function or tip wear. This information is critical for evaluating the performance and accuracy of the STM tip and can help diagnose problems and optimize its function.

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

20200 - Electrical engineering, Electronic engineering, Information engineering

Project

<a href="/en/project/FW03010504" target="_blank" >FW03010504: Development of in-situ techniques for characterization of materials and nanostructures</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Electrical Engineering

ISSN

1335-3632

e-ISSN

1339-309X

Volume of the periodical

75

Issue of the periodical within the volume

4

Country of publishing house

SK - SLOVAKIA

Number of pages

7

Pages from-to

268-274

UT code for WoS article

001288026300001

EID of the result in the Scopus database

2-s2.0-85201095770