In situ nano indentation module for AFM in SEM LiteScope ™

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000012" target="_blank" >RIV/04525671:_____/23:N0000012 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
In situ nano indentation module for AFM in SEM LiteScope ™
Original language description
An application note is a document detailing the use of a technique or application of an instrument. In this case, the application note describes an in-situ nanoindentation module for the LiteScope microscope that can be used in conjunction with the electron microscope. This module allows quantitative analysis of the mechanical properties of materials by nanoindentation testing. It is designed to be integrated into a scanning electron microscope (SEM) and enables high-resolution micromechanical experiments. Advantages of this combined solution include accurate localization of nanostructures, the possibility of combination with other SEM techniques (EBSD, EDX), fast nanoindentation measurements, accurate AFM probe positioning by SEM, and easy repeatability of localization of the same region. The application note also provides examples of TRIP steel and steel material analysis using a combination of EBSD, SEM, AFM and nanoindentation techniques.
Czech name
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Czech description
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Project
<a href="/en/project/FV40238" target="_blank" >FV40238: Advanced microsocpy techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2023
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

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