AFM-in-SEM LiteScope™
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F04525671%3A_____%2F23%3AN0000013" target="_blank" >RIV/04525671:_____/23:N0000013 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
AFM-in-SEM LiteScope™
Original language description
A product data sheet is a document that contains a detailed description of a specific device and its features. This product data sheet describes the AFM-in-SEM LiteScope™, which is a unique atomic force microscope (AFM) integrated into a scanning electron microscope (SEM). The new correlation probe and electron microscopy (CPEM) technology enables real-time correlation of AFM and SEM data. The coupling of AFM and SEM enables complex sample analysis that is difficult when using separate devices. The main advantages include comprehensive and correlation analysis, in-situ sample characterization and accurate localization of the region of interest. The development of the product list has been significantly influenced by the contribution of the project to develop an AFM microscope with 'fast imaging' and adaptive scanning capability, together with software modules for advanced image processing in correlation microscopy.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
21000 - Nano-technology
Result continuities
Project
<a href="/en/project/FV40238" target="_blank" >FV40238: Advanced microsocpy techniques</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2023
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.