The use of scanning probe microscopy for a thin layer quality control
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24210%2F13%3A%230005715" target="_blank" >RIV/46747885:24210/13:#0005715 - isvavai.cz</a>
Alternative codes found
RIV/46747885:24620/13:#0000343
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
The use of scanning probe microscopy for a thin layer quality control
Original language description
It is possible to modify physical and chemical properties (e.g. hardness, corrosion- and abrasion resistance, friction coefficient, etc.) of base material through the thin layer deposition. The scanning probe microscopy could be used for the precise characterization thin layer properties. Through the scanning probe microscopy it is easily possible to determine e.g. 3D topology, nanohardness, elasticity, adhesion, electrical and thermal conductivity etc.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
JK - Corrosion and material surfaces
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED0005%2F01%2F01" target="_blank" >ED0005/01/01: Centre for nanomaterials, advanced technologies and innovation</a><br>
Continuities
V - Vyzkumna aktivita podporovana z jinych verejnych zdroju
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů