All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Use of Computed Tomography in Dimensional Quality Control and NDT

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24210%2F20%3A00008243" target="_blank" >RIV/46747885:24210/20:00008243 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21220/20:00345683

  • Result on the web

    <a href="https://journalmt.com/pdfs/mft/2020/05/19.pdf" target="_blank" >https://journalmt.com/pdfs/mft/2020/05/19.pdf</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.21062/MFT.2020.108" target="_blank" >10.21062/MFT.2020.108</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Use of Computed Tomography in Dimensional Quality Control and NDT

  • Original language description

    © 2020 Manufacturing Technology. All rights reserved The article deals with the application of computed tomography in dimensional quality control. The advantage of computed tomography is that the measured part is not influenced by measuring force. It is possible to measure complex parts and assemblies, their geometry, internal structure and defects in one step. The disadvantage of CT is decreasing accuracy and resolution when measuring high density materials or large parts, caused by the use of high accelerating voltage and current. The measurement result is influenced by many factors, not only the instrument itself and the set of measuring parameters, but it also largely depends on the sample material and even its geometry. Based on the requirements for dimensional inspection, an analysis of Zeiss METROTOM 1500 computed tomography X-Ray spot size was conducted. The dependence of the spot size of the X-Ray source on the accelerating voltage and current was determined for the given instrument, as well as the relation between the voxel size and the distance of the sample from the detector. Spot size and voxel size has to be in relation, since large spot size goes against small voxel size (resolution). Using calibration artefact, the influence of the acceleration voltage on the accuracy when measuring form and size of a sphere and the distance between centres of 2 spheres was evaluated.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>SC</sub> - Article in a specialist periodical, which is included in the SCOPUS database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF16_019%2F0000826" target="_blank" >EF16_019/0000826: Center of Advanced Aerospace Technology</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Manufacturing Technology

  • ISSN

    1213-2489

  • e-ISSN

  • Volume of the periodical

    20

  • Issue of the periodical within the volume

    5

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    10

  • Pages from-to

    566-575

  • UT code for WoS article

  • EID of the result in the Scopus database

    2-s2.0-85099042405