A Reliability Lab-on-chip Using Programmable Arrays
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F14%3A%230003130" target="_blank" >RIV/46747885:24220/14:#0003130 - isvavai.cz</a>
Result on the web
<a href="http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=6&SID=R2Ihc8Vb4DCzHkD6jzl&page=1&doc=2" target="_blank" >http://apps.webofknowledge.com/full_record.do?product=UA&search_mode=GeneralSearch&qid=6&SID=R2Ihc8Vb4DCzHkD6jzl&page=1&doc=2</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IRPS.2014.6861123" target="_blank" >10.1109/IRPS.2014.6861123</a>
Alternative languages
Result language
angličtina
Original language name
A Reliability Lab-on-chip Using Programmable Arrays
Original language description
This paper presents a new concept of a reliability labon-chip-an ultimate platform for complete in-situ measurement, processing and evaluation of a chip reliability parameters, including aging purposes. It is shown how multiple test structures, includingthe measurement blocks, can be ad-hoc created and evaluated directly on a Field-Programmable Gate Array (FPGA) chip. Results from measurements including 45 nm and 28 nm processes are presented as well.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LD13019" target="_blank" >LD13019: Improvement in Reliability of Nano-scale circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
52nd IEEE International Reliability Physics Symposium, IRPS 2014
ISBN
978-1-4799-3317-4
ISSN
1541-7026
e-ISSN
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Number of pages
8
Pages from-to
"CA.6.1"-"CA.6.8"
Publisher name
IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Place of publication
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Event location
Waikoloa, HI; United States
Event date
Jan 1, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000343833200125