Test Compression Using Extended Nonlinear Binary Codes

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F18%3A00006122" target="_blank" >RIV/46747885:24220/18:00006122 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8474242&isnumber=8474071" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8474242&isnumber=8474071</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/IOLTS.2018.8474242" target="_blank" >10.1109/IOLTS.2018.8474242</a>

Result language
angličtina
Original language name
Test Compression Using Extended Nonlinear Binary Codes
Original language description
The linear binary codes can be extended by a relatively high number of nonlinear check bits in such a way that the code words preserve the value of the maximum number of independently specified bits from the original linear code words. A substantial improvement can be achieved in the field of sequential pattern compression using these nonlinear codes. The number of scan chains loaded in parallel can be increased while the number of specified bits is kept. We propose an algorithm that finds the appropriate nonlinear modification circuit structure and verifies the test pattern quality for different numbers of care bits in a test pattern.
Czech name
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Czech description
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Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)
ISBN
978-153865992-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
255-256
Publisher name
IEEE
Place of publication
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Event location
Platja d'Aro, Spain
Event date
Jan 1, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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