Accelerated recrystallization of nanocrystalline films as a manifestation of the inner size effect of the diffusion coefficient

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24620%2F24%3A00012361" target="_blank" >RIV/46747885:24620/24:00012361 - isvavai.cz</a>

Result on the web

<a href="https://www.sciencedirect.com/science/article/pii/S0042207X24003956?via%3Dihub#fig3" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0042207X24003956?via%3Dihub#fig3</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.vacuum.2024.113349" target="_blank" >10.1016/j.vacuum.2024.113349</a>

Result language

angličtina

Original language name

Accelerated recrystallization of nanocrystalline films as a manifestation of the inner size effect of the diffusion coefficient

Original language description

The work is devoted to the study of recrystallization occurring during short-term annealing of 100 nm thick polycrystalline films of copper and silver. It is found that in copper films deposited by the method of thermal evaporation onto a substrate at room temperature, a bimodal crystallite size distribution with maxima at 15 and 35 nm is observed. The bimodal distribution in copper films is preserved during annealing, which leads to a shift of both peaks of the crystallite size distribution histograms to the larger sizes region. In contrast to Cu, even in as-deposited Ag films, besides the nanosized fraction, micron-sized crystallites are present. Apparently, these grains are formed due to the phenomenon of self-annealing and weakly evolve during heating owing to grain growth stagnation. The nanosized fraction in as-deposited Ag films is represented by crystallites with the most probable size of 25 nm, which increases to 50 nm as a result of short-term annealing at the temperature of 250°C. The grain-boundary diffusion coefficient was determined, which is more than 10-18 m2/s for both films of metals. The obtained value indicates a multiple intensification of self-diffusion processes in films, the thickness of which allows us to refer them to macroscopic sample

Czech name

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Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

20500 - Materials engineering

Project

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Continuities

R - Projekt Ramcoveho programu EK

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Vacuum

ISSN

0042-207X

e-ISSN

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Volume of the periodical

226

Issue of the periodical within the volume

August

Country of publishing house

GB - UNITED KINGDOM

Number of pages

12

Pages from-to

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UT code for WoS article

001250107400001

EID of the result in the Scopus database

2-s2.0-85194875032