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Optimization of PCB Design Assembly Using Yield Prediction

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F08%3A00500807" target="_blank" >RIV/49777513:23220/08:00500807 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optimization of PCB Design Assembly Using Yield Prediction

  • Original language description

    The paper deals with optimization of printed circuit board design using yield prediction. Yield prediction of PCB assembly process can be obtained from the below presented yield model. The model is based on a combination of elements from two most used yield prediction methodologies, namely: process yield and board design yield. Due to PCB assembly process yield prediction is possible not only to assist the manufacturers in determining reliable estimates of production capabilities, but also to optimize PCB design process. Through the use of sensitivity analysis can be determined the effect that each component package has on the manufacturing yield. The component packages having the biggest influence on the manufacturing yield loss represent potential failure areas. Due to this information is possible to optimize PCB design before the start of mass production in order to minimize or even to eliminate these problematic component packages.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JS - Reliability and quality management, industrial testing

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    ISEE 2008

  • ISBN

    978-1-4244-3973-7

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Budapešť

  • Event date

    Jan 1, 2008

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000272337900069