Defect Level Prediction of Printed Circuit Board Assembly Manufacturing based on DPMO Metric
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F11%3A43924998" target="_blank" >RIV/49777513:23220/11:43924998 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05744196" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05744196</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Defect Level Prediction of Printed Circuit Board Assembly Manufacturing based on DPMO Metric
Original language description
This paper presents a defect level prediction tool based on Defects per Million Opportunities (DPMO) metric, which is intended for newly designed printed circuit board assemblies (PCBAs), especially ones determined for automotive industry. Due to this tool is possible to analyze and assess test strategy alternatives by using the estimated defects.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JS - Reliability and quality management, industrial testing
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Electronic Version of the Proceedings of the 8th Spanish Conference on Electron Devices
ISBN
978-1-4244-7863-7
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
195-198
Publisher name
Universitat de les Illes Balears
Place of publication
Palma de Mallorca, Španělsko
Event location
Palma de Mallorca, Španělsko
Event date
Feb 8, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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