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Effect of multiple reflow cycles on intermetallic compound creation

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F15%3A43925342" target="_blank" >RIV/49777513:23220/15:43925342 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7247995&newsearch=true&queryText=Effect%20of%20multiple%20reflow%20cycles%20on%20intermetallic%20compound%20creation" target="_blank" >http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7247995&newsearch=true&queryText=Effect%20of%20multiple%20reflow%20cycles%20on%20intermetallic%20compound%20creation</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2015.7247995" target="_blank" >10.1109/ISSE.2015.7247995</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Effect of multiple reflow cycles on intermetallic compound creation

  • Original language description

    This paper deals with the effect of the solder profile and multiple reflow cycles on intermetallic compound (IMC) creation. Soldered joints between PCB and 1206 size chip resistors were made from SAC 305 or SnBi solder alloy. Samples were reflowed one tosix times with one of the two different soldering profiles for each soldering alloys. The thickness and composition of IMC layers were measured and observed with a scanning electron microscope. The growing of IMC layers thickness was observed. The results are presented depending on greater value of heating factor and number of reflow cycles. The shear forces for the components were measured and the fracture interfaces were inspected.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 2015 38th International Spring Seminar on Electronics Technology (ISSE 2015)

  • ISBN

    978-1-4799-8860-0

  • ISSN

    2161-2528

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    1-5

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Eger, Maďarsko

  • Event date

    May 6, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article