Using VHDL-AMS to simulate aging behavior of electronic components

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F16%3A43929301" target="_blank" >RIV/49777513:23220/16:43929301 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/document/7577248/" target="_blank" >http://ieeexplore.ieee.org/document/7577248/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/AE.2016.7577248" target="_blank" >10.1109/AE.2016.7577248</a>

Result language
angličtina
Original language name
Using VHDL-AMS to simulate aging behavior of electronic components
Original language description
Reliability of electronics is in the automotive industry very important. The average age of cars in Germany was 9 years at 2015.i Normally the life time is evaluated by the environmental test according ISO 16750. The content of this paper is to contribute that computer simulation of aging is a possible way to evaluate electronic circuits in the define phase. For this reason a VHDL-AMS simulation models is used to model aging behavior of a resistor.
Czech name
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Czech description
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Project
—
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
International Conference on Applied Electronics (AE 2016) : proceedings
ISBN
978-80-261-0601-2
ISSN
1803-7232
e-ISSN
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Number of pages
4
Pages from-to
89-92
Publisher name
IEEE
Place of publication
Piscataway
Event location
Pilsen, Czech Republic
Event date
Sep 6, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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