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Experimental validation of IGBT thermal impedances from voltage-based and direct temperature measurements

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F16%3A43929828" target="_blank" >RIV/49777513:23220/16:43929828 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/7793673/" target="_blank" >http://ieeexplore.ieee.org/document/7793673/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/IECON.2016.7793673" target="_blank" >10.1109/IECON.2016.7793673</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Experimental validation of IGBT thermal impedances from voltage-based and direct temperature measurements

  • Original language description

    Temperature measurement on IGBT modules using voltage-based, direct and infrared methods is presented. The measured temperatures from all three methods are used in determining thermal impedances of IGBT and diodes for air cooled IGBT modules at different air flowrates. Thermal impedances for both active and passive switching elements are measured and the corresponding Foster network is established. The measured temperature and corresponding thermal impedances calculated from measured temperatures using the direct and voltage-based temperature measurement approach are validated using infrared temperature measurements and corresponding thermal impedances calculated from infrared measured temperatures. Finally, thermal impedances calculated from maximum measured IGBT and diode temperatures are compared to those obtained from measured average IGBT and diode temperatures.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the IECON 2016 : 42nd Annual Conference of the IEEE Industrial Electronics Society

  • ISBN

    978-1-5090-3474-1

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    3396-3401

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Florence, Italy

  • Event date

    Oct 24, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article