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Higher Temperature Washing of Electrically Connected SMD Components onto the Textile Ribbons

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F22%3A43965463" target="_blank" >RIV/49777513:23220/22:43965463 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/9812785" target="_blank" >https://ieeexplore.ieee.org/document/9812785</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE54558.2022.9812785" target="_blank" >10.1109/ISSE54558.2022.9812785</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Higher Temperature Washing of Electrically Connected SMD Components onto the Textile Ribbons

  • Original language description

    This article addresses the higher temperature washing reliability research of interconnection technique for mounting SMD (surface mounted device) components onto conductive stretchable textile ribbons. It can be concluded that both tested interconnection technologies (i.e. low-temperature soldering and adhesive bonding) have some pros and cons, and both technologies are usable for dedicated applications. The results for soldered samples are better and stable for both tested washing temperatures 60°C and 92°C and are suitable especially for power supply applications or heating. The adhesive bonded joints have acceptable results only for 60°C washing temperature and are suitable for sensors, illumination, data transfer applications, or components with multiple leads. The research also shows that prepared joints have higher endurance than the whole ribbon.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/EF18_069%2F0009855" target="_blank" >EF18_069/0009855: Electrical Engineering Technologies with High-Level of Embedded Intelligence</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2022

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2022 45th International Spring Seminar on Electronics Technology : /proceedings/

  • ISBN

    978-1-66546-589-2

  • ISSN

    2161-2536

  • e-ISSN

    2161-2536

  • Number of pages

    5

  • Pages from-to

    1-5

  • Publisher name

    IEEE

  • Place of publication

    Piscaway

  • Event location

    Vienna, Austria

  • Event date

    May 11, 2022

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000853642200032