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Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F11%3A43898490" target="_blank" >RIV/49777513:23520/11:43898490 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.apsusc.2011.10.039" target="_blank" >http://dx.doi.org/10.1016/j.apsusc.2011.10.039</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsusc.2011.10.039" target="_blank" >10.1016/j.apsusc.2011.10.039</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Properties of nanocrystalline Al-Cu-O films reactively sputtered by DC pulse dual magnetron

  • Original language description

    The article reports on the effect of the addition of Cu in the Al2O3 film on its mechanical and optical properties. The Al-Cu-O films were reactively co-sputtered using DC pulse dual magnetron in a mixture of argon and oxygen. The amount of Al and Cu inthe Al-Cu-O film was controlled by the length of pulse at the Al/Cu target. It is shown that the structure of Al-Cu-O film gradually varies with increasing Cu content from Al2O3 through Al-Cu-O nanocrystalline solid solution to CuAl2O4 spinel structure.The Al-Cu-O films exhibit (i) relatively high hardness (ii) enhanced elastic recovery (iii) low values of Young's modulus and (iv) enhanced resistance to cracking during indentation under high load.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BL - Plasma physics and discharge through gases

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/OC10045" target="_blank" >OC10045: Novel plasma sources for film deposition and surface modification</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    APPLIED SURFACE SCIENCE

  • ISSN

    0169-4332

  • e-ISSN

  • Volume of the periodical

    2011

  • Issue of the periodical within the volume

    258

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    1762-1767

  • UT code for WoS article

  • EID of the result in the Scopus database