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ZnO:Al films prepared by rf magnetron sputtering applied as back reflectors in thin-film silicon solar cells

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F08%3A00501212" target="_blank" >RIV/49777513:23640/08:00501212 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    ZnO:Al films prepared by rf magnetron sputtering applied as back reflectors in thin-film silicon solar cells

  • Original language description

    The substrate temperature significantly affects the crystallite size, the effect of the rf. power and pressure on the crystallite size is less pronounced. The largest crystallite size of 300 nm was determined in films deposited in the range of 75 °C to 100 °C. The increasing substrate temperature enhances the doping efficiency resulting in films with a lower resistivity and wider optical gap. The use of the optimal sputtering conditions (75 oC to 100 oC, 1 ?bar and 800 W) for depositing ZnO:Al back reflector in a-Si:H solar cells resulted in an S-shaped J-V curve and a low fill factor. By using an increased pressure of 25 ?bar during sputtering of the ZnO:Al a relative increase of 10 % in the efficiency was achieved in comparison to the cell without the ZnO:Al. The improvement resulted mainly from an enhancement of ~ 1.3 mA/cm2 in the short circuit current.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/1M06031" target="_blank" >1M06031: Materials and components for environment protection</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

  • Volume of the periodical

    516

  • Issue of the periodical within the volume

    21

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    7

  • Pages from-to

  • UT code for WoS article

    000259727900096

  • EID of the result in the Scopus database