Resistivity measurement and conductivity type determination for semiconducting materials using a four-point probe

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F11%3A43897228" target="_blank" >RIV/49777513:23640/11:43897228 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Resistivity measurement and conductivity type determination for semiconducting materials using a four-point probe
Original language description
Resistivity and conductivity type, fundamental properties of semiconductors, are critical parameters in both materials research and after fabrication. A 4-point collinear probe and the appropriate test equipment can be used to determine both resistivityand conductivity type. Using 4 probes eliminates errors due to the probe resistance, the spreading resistance under each probe, and the contact resistance between probe and the semiconductor material.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th International Conference on Applied Physics of Condensed Matter
ISBN
978-80-554-0386-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
220-223
Publisher name
Univerzita v Žilině
Place of publication
Žilina
Event location
Spa Nový Smokovec, High Tatras, Slovakia
Event date
Jun 22, 2011
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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