Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F14%3A43922286" target="_blank" >RIV/49777513:23640/14:43922286 - isvavai.cz</a>

Alternative codes found

RIV/00177016:_____/14:#0001041 RIV/00216305:26110/14:PU112331

Result on the web

<a href="http://dx.doi.org/10.1088/0957-0233/25/4/044022" target="_blank" >http://dx.doi.org/10.1088/0957-0233/25/4/044022</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/0957-0233/25/4/044022" target="_blank" >10.1088/0957-0233/25/4/044022</a>

Result language

angličtina

Original language name

Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy

Original language description

Scanning thermal microscopy (SThM) is a scanning probe microscopy technique for mapping temperature and thermal properties of solid surfaces with very high resolution. It has been used for the determination of various thermophysical properties in the past and it delivers better lateral resolution than any other thermal technique. Absolute determination of thermal conductivity using SThM, however, is still problematic due to the complex nature of the heat exchange between the probe and sample. In this paper we present a method for thin film thermal conductivity determination based on the use of thin film defects-delaminations. We show that, using a combination of bonded and debonded film measurements together with numerical analysis, we can use a singleSThM measurement to determine the isotropic thermal conductivity of the film, without a priori knowledge of probe-sample junction properties.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JB - Sensors, detecting elements, measurement and regulation

OECD FORD branch

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Project

<a href="/en/project/FR-TI1%2F241" target="_blank" >FR-TI1/241: Components for nano-diagnostic of length fluctuations, deviation of shapes and surface faults</a><br>

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2014

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Measurement Science and Technology

ISSN

0957-0233

e-ISSN

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Volume of the periodical

25

Issue of the periodical within the volume

4

Country of publishing house

GB - UNITED KINGDOM

Number of pages

7

Pages from-to

1-7

UT code for WoS article

000332932800023

EID of the result in the Scopus database

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