Analysis of total hemispherical emissivity of samples with a thin film and a protective film

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F14%3A43924731" target="_blank" >RIV/49777513:23640/14:43924731 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Analysis of total hemispherical emissivity of samples with a thin film and a protective film

Original language description

In the present work there is described development of measurement method of total hemispherical emissivity based on spectral reflectivity measurement by means of FTIR spectrometer for polished samples with a thin film and a protective film (combination of diffuse and specular methods). Emissivities of samples with different protective coatings were analysed. Measurements were analysed, best candidates were chosen and recommendations were made for the space program.

Czech name

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Czech description

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Type

V_souhrn - Summary research report

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

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Continuities

N - Vyzkumna aktivita podporovana z neverejnych zdroju

Publication year

2014

Confidentiality

C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

Number of pages

16

Place of publication

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Publisher/client name

Frentech Aerospace s.r.o.

Version

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