Thin films against multilayers of a-Si:H: Comparative study on optical properties

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F19%3A43956827" target="_blank" >RIV/49777513:23640/19:43956827 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.5119482" target="_blank" >http://dx.doi.org/10.1063/1.5119482</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.5119482" target="_blank" >10.1063/1.5119482</a>

Result language
angličtina
Original language name
Thin films against multilayers of a-Si:H: Comparative study on optical properties
Original language description
This paper presents studies on structure and optical properties of a-Si:H thin films and multilayers of a-Si:H prepared at two different hydrogen dilutions. For all samples detected as amorphous with low microstructure factor UV Vistransmittance spectra were used to extract refractive indices, absorption coefficients and optical band gap energies. Refractive indices decrease with the thin film/multilayer thickness what means materials of lower density. On the contrary optical band gaps determined via the Tauc procedure were found to be blue-shifted with increasing both the film and multilayer thickness what is beneficial for solar applications.
Czech name
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Czech description
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Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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