Mechanical properties of systems thin film - substrate

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A_____%2F00%3A00053413" target="_blank" >RIV/49777513:_____/00:00053413 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Mechanical properties of systems thin film - substrate

Original language description

Mechanical properties of thin film-substrate systems are measured on TiN-HSS thin films prepared by reactive cathodic arc evaporation in vacuum. Special methodology is used to investigate the resistance of systems to local stress wear. The investigationof mechanical properties is concetrated on adhesive and cohesive behavior, wear resistance, microhardness testing, and fracture behavior of these hard films.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JK - Corrosion and material surfaces

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Mechanical properties of systems thin film - substrate

ISBN

8070826177

ISSN

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e-ISSN

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Number of pages

10

Pages from-to

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Publisher name

Západočeská univerzita

Place of publication

Plzeň

Event location

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Event date

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Type of event by nationality

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UT code for WoS article

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