Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60162694%3AG43__%2F24%3A00558572" target="_blank" >RIV/60162694:G43__/24:00558572 - isvavai.cz</a>
Alternative codes found
RIV/62156489:43110/23:43922460
Result on the web
<a href="https://reader.elsevier.com/reader/sd/pii/S026322412201418X?token=BFE43D5907D672C0ADB7C3DDBFD8E847EE3BDFFCC91088EAEA4A5AA788959F2F300269B27AFB8CEB6B64DC50ADF1E41B&originRegion=eu-west-1&originCreation=20221127094545" target="_blank" >https://reader.elsevier.com/reader/sd/pii/S026322412201418X?token=BFE43D5907D672C0ADB7C3DDBFD8E847EE3BDFFCC91088EAEA4A5AA788959F2F300269B27AFB8CEB6B64DC50ADF1E41B&originRegion=eu-west-1&originCreation=20221127094545</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.measurement.2022.112222" target="_blank" >10.1016/j.measurement.2022.112222</a>

Result language
angličtina
Original language name
Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process
Original language description
This article is devoted to estimating and demonstrating some LED reliability measures, such as the time during which the LED operation is failure-free and at the required luminance level. Our approach is based on multiply-accelerated reliability testing with very long experiment run supported by degradation modelling using a stochastic diffusion process. Multiple acceleration is provided by intensifying environmental climatic effects (heat exposure) and simultaneously increasing the stress of operating conditions (increased current load). The parameters for degradation models based on stochastic diffusion processes are estimated for the studied LEDs by a specific form of the maximum likelihood estimation (MLE) method, including parameter confidence intervals. Based on the results, the novel correlation between luminance level, luminous flux intensity and voltage magnitude is also determined. The aim is to estimate and demonstrate key LED reliability measures.
Czech name
—
Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
21100 - Other engineering and technologies

Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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