Setting of causes of adhesive bonds destruction by means of optical analysis
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60460709%3A41310%2F14%3A67190" target="_blank" >RIV/60460709:41310/14:67190 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Setting of causes of adhesive bonds destruction by means of optical analysis
Original language description
A research analyses an influence of an adhesive surface treatment on an adhesive bond strength. Constructional adhesives used for bonding in an automotive industry were used for the research. A significant factor for evaluating the adhesive bond failureis the research of bonded areas by means of an optical analysis. An even layer of the adhesive in the bond is connected with it. The adhesive bonds diagnostics is difficult. It is necessary to control a quality of the production at the production process. A significant factor lowering the resultant strength of the adhesive bond is its creation. One of possibilities of the adhesive bond diagnostics is to use a method of an optical analysis. An uneven layer of the adhesive belongs among main causes of a failure/considerable decrease of the strength of the adhesive bond.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JR - Other machinery industry
OECD FORD branch
—
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Manufacturing Technology
ISSN
1213-2489
e-ISSN
—
Volume of the periodical
14
Issue of the periodical within the volume
3
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
5
Pages from-to
371-375
UT code for WoS article
—
EID of the result in the Scopus database
—