Properties of Au nanolayer sputtered on polyethyleneterephthalate

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F10%3A00023010" target="_blank" >RIV/60461373:22310/10:00023010 - isvavai.cz</a>
Alternative codes found
RIV/44555601:13440/10:00005507 RIV/00216275:25310/10:39881666
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Properties of Au nanolayer sputtered on polyethyleneterephthalate
Original language description
AFM, XRD, zeta (zeta) potential measurement and spectroscopic ellipsometry were used for characterization of thin (20 nm) Au films sputtered onto polyethyleneterephthalate (PET). Sputtered Au film shows significantly different Surface morphology and roughness in comparison with pristine PET. From XRD measurement of 20 nm thick sputtered Au layers it was found that Au crystalizes preferentially in (1 1 1) direction with lattice parameter of a = 0.40769 nm, density of rho = 19.338 g cm(-3) and lattice stress of about 230 MPa. Higher surface conductance of Au/PET by zeta-potential measurement was found. Au layer thickness of 19.4 nm determined from spectroscopic ellipsometry was in good agreement with the AFM estimated value of 20 nm.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CD - Macromolecular chemistry
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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