The Structural and Compositional Changes of Graphene Oxide Induced by Irradiation With 500 keV Helium and Gallium Ions
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F18%3A43916032" target="_blank" >RIV/60461373:22310/18:43916032 - isvavai.cz</a>
Alternative codes found
RIV/61389005:_____/19:00507405
Result on the web
<a href="https://onlinelibrary.wiley.com/doi/epdf/10.1002/pssb.201800409" target="_blank" >https://onlinelibrary.wiley.com/doi/epdf/10.1002/pssb.201800409</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssb.201800409" target="_blank" >10.1002/pssb.201800409</a>
Alternative languages
Result language
angličtina
Original language name
The Structural and Compositional Changes of Graphene Oxide Induced by Irradiation With 500 keV Helium and Gallium Ions
Original language description
Structural and compositional modification of 2D materials as graphene or graphene oxide (GO) are topical objects of nowadays due to their many technological applications. Ion irradiation of graphene based materials, as a method for improvement of their surface properties started recently. Ion mass, energy, and fluence are crucial for forming of GO electrical, optical, and mechanical properties. In this work, the GO films are irradiated with 500 keV He and Ga ions to different fluences. The ions with different masses and electronic/nuclear stopping power ratios, are chosen with the aim to examine mechanisms of radiation defect creation. The elemental composition of the GO is investigated using Rutherford back-scattering (RBS) and elastic recoil detection analysis (ERDA) techniques. The structural and chemical changes are characterized by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy and the electrical properties are determined by two-point method. The RBS and ERDA analyses indicate deoxygenation and dehydrogenation of the irradiated GO surface. The thickness and the degree of O and H depletion depend on the ion mass. XPS and Raman spectroscopy show removal of oxygen functionalities and structural modifications leading to a decrease in the surface resistivity.
Czech name
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Czech description
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Classification
Type
J<sub>SC</sub> - Article in a specialist periodical, which is included in the SCOPUS database
CEP classification
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OECD FORD branch
10402 - Inorganic and nuclear chemistry
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica Status Solidi (b)
ISSN
0370-1972
e-ISSN
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Volume of the periodical
neuveden
Issue of the periodical within the volume
2018
Country of publishing house
DE - GERMANY
Number of pages
8
Pages from-to
1800409
UT code for WoS article
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EID of the result in the Scopus database
2-s2.0-85059163075