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The Structural and Compositional Changes of Graphene Oxide Induced by Irradiation With 500keV Helium and Gallium Ions

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F19%3A00507405" target="_blank" >RIV/61389005:_____/19:00507405 - isvavai.cz</a>

  • Alternative codes found

    RIV/60461373:22310/18:43916032

  • Result on the web

    <a href="https://doi.org/10.1002/pssb.201800409" target="_blank" >https://doi.org/10.1002/pssb.201800409</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/pssb.201800409" target="_blank" >10.1002/pssb.201800409</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    The Structural and Compositional Changes of Graphene Oxide Induced by Irradiation With 500keV Helium and Gallium Ions

  • Original language description

    Structural and compositional modification of 2D materials as graphene or graphene oxide (GO) are topical objects of nowadays due to their many technological applications. Ion irradiation of graphene based materials, as a method for improvement of their surface properties started recently. Ion mass, energy, and fluence are crucial for forming of GO electrical, optical, and mechanical properties. In this work, the GO films are irradiated with 500keV He and Ga ions to different fluences. The ions with different masses and electronic/nuclear stopping power ratios, are chosen with the aim to examine mechanisms of radiation defect creation. The elemental composition of the GO is investigated using Rutherford back-scattering (RBS) and elastic recoil detection analysis (ERDA) techniques. The structural and chemical changes are characterized by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy and the electrical properties are determined by two-point method. The RBS and ERDA analyses indicate deoxygenation and dehydrogenation of the irradiated GO surface. The thickness and the degree of O and H depletion depend on the ion mass. XPS and Raman spectroscopy show removal of oxygen functionalities and structural modifications leading to a decrease in the surface resistivity.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Physica Status Solidi B-Basic Solid State Physics

  • ISSN

    0370-1972

  • e-ISSN

  • Volume of the periodical

    256

  • Issue of the periodical within the volume

    5

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    8

  • Pages from-to

    180409

  • UT code for WoS article

    000476946300025

  • EID of the result in the Scopus database

    2-s2.0-85059163075