Control of Turing patterns and their usage as logic gates and sensors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22340%2F11%3A43891861" target="_blank" >RIV/60461373:22340/11:43891861 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Control of Turing patterns and their usage as logic gates and sensors
Original language description
We focus on finding parameters for occurrence of Turing patterns (spatially nonuniform steady states) in the model of three coupled ideally mixed continuous stirred tank reactors arranged in a linear array. In the context of interacting cells (or subcellular units) in organisms, we took a two-variable core model of glycolysis occurring within each unit that interacts by diffusive transport with adjacent units. First, we identify Turing patterns in the system at various inhibitor-activator ratios of transport coefficients by constructing solution diagrams with a free parameter being the inhibitor rate coefficient . In particular,we chose the inhibitor/activator ratios 100/1, 1/1 and 4/5. Stable Turing patterns occur in all three cases. 64-1016 znaků. Anotace nesmí být totožná s názvem.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
CI - Industrial chemistry and chemical engineering
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings 2011 World Congress on Engineering and Technology
ISBN
978-1-61284-362-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
660-663
Publisher name
Institute of Electrical and Electronics Engineers, Inc.
Place of publication
Bejing
Event location
Shanghai
Event date
Oct 28, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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