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Dense TiO2 films grown by sol?gel dip coating on glass, F-doped SnO2, and silicon substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F13%3A00384575" target="_blank" >RIV/61388955:_____/13:00384575 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1557/jmr.2012.240" target="_blank" >http://dx.doi.org/10.1557/jmr.2012.240</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1557/jmr.2012.240" target="_blank" >10.1557/jmr.2012.240</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Dense TiO2 films grown by sol?gel dip coating on glass, F-doped SnO2, and silicon substrates

  • Original language description

    Exceptionally dense titanium dioxide (TiO2) films were prepared via dip coating from a sol containing poly(hexafluorobutyl methacrylate) as the structure-directing agent. The films were grown on glass, F-doped SnO2, and crystalline silicon (111) faces, either pure or with a thin layer of SiO2. The TiO2 films cover perfectly even rough surfaces, which was ascribed to thixotropic properties of the precursor gel. The films provide antireflection function to crystalline Si wafers for photovoltaic applications. The optical reflectance in visible to near-infrared (NIR) wave lengths region is considerably smaller for Si wafers covered by TiO2/SiO2 film compared with that of SiO2/Si. The dense TiO2 films are amorphous with small amount of anatase and monoclinic TiO2(B). These two phases withstand calcination at 900 °C in films deposited on Si. For comparison, porous TiO2 films were grown by the same dip-coating protocol, but with alternative organic additives, either polymers or ionic liquids.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CG - Electrochemistry

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Materials Research

  • ISSN

    0884-2914

  • e-ISSN

  • Volume of the periodical

    28

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    9

  • Pages from-to

    385-393

  • UT code for WoS article

    000314421700015

  • EID of the result in the Scopus database