Long-lived transient anion of c-C4F8O

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388955%3A_____%2F18%3A00487707" target="_blank" >RIV/61388955:_____/18:00487707 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.5017478" target="_blank" >http://dx.doi.org/10.1063/1.5017478</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.5017478" target="_blank" >10.1063/1.5017478</a>

Result language
angličtina
Original language name
Long-lived transient anion of c-C4F8O
Original language description
We report partial cross sections for electron attachment to c-C4F8O, a gas with promising technological applications in free-electron-rich environments. The dissociative electron attachment leads to a number of anionic fragments resulting from complex bond-breaking and bond-forming processes. However, the anion with the highest abundance is the non-dissociated (transient) parent anion which is formed around 0.9 eV electron energy. Its lifetime reaches tens of microseconds. We discuss the origin of this long lifetime, the anion's strong interactions with other molecules, and the consequences for electron scavenging properties of c-C4F8O in denser environments, in particular for its use in mixtures with CO2 and N-2. Published by AIP Publishing.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10403 - Physical chemistry

Project
<a href="/en/project/GA17-04844S" target="_blank" >GA17-04844S: Cross sections and dynamics of electron scattering on molecular systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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