Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61388998%3A_____%2F10%3A00342304" target="_blank" >RIV/61388998:_____/10:00342304 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy
Original language description
The laser-based modal resonant ultrasound spectroscopy is modified for measurements of thin surface layers on a substrate. This paper describes determination of all in-plane elastic properties of thin layers from small resonant frequency shifts of substrate induced by deposition of the layer.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BI - Acoustics and oscillation
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA101%2F09%2F0702" target="_blank" >GA101/09/0702: Mechanical properties of functional surface layers of submicron thicknesses</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Physics: Conference Series
ISSN
1742-6588
e-ISSN
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Volume of the periodical
214
Issue of the periodical within the volume
1
Country of publishing house
BE - BELGIUM
Number of pages
5
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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