Characterisation of Ni+ implanted PEEK, PET and PI
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F09%3A00324684" target="_blank" >RIV/61389005:_____/09:00324684 - isvavai.cz</a>
Alternative codes found
RIV/60461373:22310/09:00021552 RIV/44555601:13440/09:00004840
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterisation of Ni+ implanted PEEK, PET and PI
Original language description
Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40 keV Ni+ ions at room temperature at fluences ranging from 10^16 to 1.5x10^17 ions cm-2. The depth profiles of the implanted Ni atoms were determined bythe RBS technique and compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV?vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV?vis results indicated an increase of the concentration of double bonds, XPS showed increasing concentration Ni0+ with the increasing ion fluence.
Czech name
Charakterizace polymerů PEEK, PET a PI implantovaných Ni+ ionty
Czech description
Polymery polyimid (PI), polyetereterketon (PEEK) a polyetyléntereftalát (PET) byly implantovány Ni+ ionty s energií 40 keV a při tocích od 10^16 do 1.5x10^17 iontů/cm2. Hloubkové profily implantovaných Ni atomů byly analyzovány metodou RBS a srovnávány se simulacemi programy SRIM a TRIDYN. Úbytek vodíku byl sledován v závislosti na toku iontů metodou ERDA a změny struktury a chemického složení byly rovněž analyzovány UV-vis spektroskopií a metodou XPS. Profily implantovaných dopantů se lišily signifikantně od profilů simulovaných s využitím SRIM, TRIDYN uspokojivě interpretoval hloubkové profily Ni pro nižší implantační toky. UV-vis spektroskopie identikovala zvýšenou koncentraci dvojných vazeb, XPS koncentraci Ni0+ v souvislosti s rostoucím tokem Ni+iontů.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BG - Nuclear, atomic and molecular physics, accelerators
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nuclear Instruments & Methods in Physics Research Section B
ISSN
0168-583X
e-ISSN
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Volume of the periodical
267
Issue of the periodical within the volume
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Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
4
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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