The Characterisation of Silicate Glasses Implanted with Ag+ Ions

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F11%3A00370848" target="_blank" >RIV/61389005:_____/11:00370848 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >http://dx.doi.org/10.1063/1.3665331</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.3665331" target="_blank" >10.1063/1.3665331</a>

Result language
angličtina
Original language name
The Characterisation of Silicate Glasses Implanted with Ag+ Ions
Original language description
Silica-based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica-based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm-2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X-ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM-2008. The optical properties of the prepared nanostructures were examined by UV-VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post-implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.
Czech name
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Czech description
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Project
<a href="/en/project/GA106%2F09%2F0125" target="_blank" >GA106/09/0125: Preparation and characterization of metal/polymer structures</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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