Silicon carbide detectors for diagnostics of laser-produced plasmas
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F19%3A00517693" target="_blank" >RIV/61389005:_____/19:00517693 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2527311" target="_blank" >http://dx.doi.org/10.1117/12.2527311</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2527311" target="_blank" >10.1117/12.2527311</a>
Alternative languages
Result language
angličtina
Original language name
Silicon carbide detectors for diagnostics of laser-produced plasmas
Original language description
Recently developed silicon carbide (SiC) detectors have been employed to study pulsed laser plasmas produced by irradiation of a double-stream gas puff target with nanosecond laser pulses. The plasma emitted by a gas-puff target source in the soft X-ray (SXR, λ = 0.1 - 10 nm) and extreme ultraviolet (EUV, λ = 10 - 120 nm) ranges was monitored with silicon carbide (SiC) detectors and compared with a commercial, calibrated silicon (Si) photodiode (AXUV-HS1). Different filters have been used to select the emission in different wavelength ranges from the broad-band emission of the plasma. This work shows the applicability of SiC detectors to measure the SXR and EUV ns pulses from the plasma, useful for monitoring and optimizing the gas-puff laser-plasma sources developed at IOE-MUT, in Warsaw (Poland). Some aspects relative to the plasma stability as well as characterization of the plasma source (i.e. the overall evaluation of the signal and the time trace profile) will be presented and discussed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
<a href="/en/project/GA19-02804S" target="_blank" >GA19-02804S: Nanostructured heterojunctions for chemiresistors</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of SPIE - The International Society for Optical Engineering
ISBN
9781510627307
ISSN
0277-786X
e-ISSN
—
Number of pages
7
Pages from-to
110320W
Publisher name
SPIE
Place of publication
Bellingham
Event location
Praha
Event date
Apr 3, 2019
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
000535354700025