Source-drain electrical conduction and radiation detection in graphene-based field effect transistor (GFET)

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389005%3A_____%2F22%3A00556281" target="_blank" >RIV/61389005:_____/22:00556281 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1088/1748-0221/17/02/P02008" target="_blank" >https://doi.org/10.1088/1748-0221/17/02/P02008</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/17/02/P02008" target="_blank" >10.1088/1748-0221/17/02/P02008</a>

Result language
angličtina
Original language name
Source-drain electrical conduction and radiation detection in graphene-based field effect transistor (GFET)
Original language description
Electrical measurements on a graphene field effect transistor (GFET) are presented and discussed for its characterization in vacuum and in air. In this last environment three low output power continuous wave (CW) led lasers and a UV lamp have been used to study the illumination effects at wavelengths from the near infrared (NIR) to red, green up to near UV. In air the device is sensitive to visible and UV radiation. The visible light produces charge carriers increasing the source-drain current. Instead, the UV radiation induces the graphene oxidation decreasing the source-drain current in a permanent way. Small temperature increments, up to about 55 degrees C, increase the electrical conduction. Larger temperatures and prolonged heating in air generate oxidation, decreasing the source-drain current. As far as the NIR radiation is concerned, no effect is observed. Therefore, these preliminary investigations indicate that the device can be employed as visible and UV radiation detector.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Project
<a href="/en/project/EF16_013%2F0001812" target="_blank" >EF16_013/0001812: Center of Accelerators and Nuclear Analytical Methods - OP</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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