All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

HARPA: Solutions for Dependable Performance under Physically Induced Performance Variability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27240%2F15%3A10229627" target="_blank" >RIV/61989100:27240/15:10229627 - isvavai.cz</a>

  • Alternative codes found

    RIV/61989100:27740/15:10229627

  • Result on the web

    <a href="http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7363685" target="_blank" >http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7363685</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/SAMOS.2015.7363685" target="_blank" >10.1109/SAMOS.2015.7363685</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    HARPA: Solutions for Dependable Performance under Physically Induced Performance Variability

  • Original language description

    Transistor miniaturization, combined with the dawn of novel switching semiconductor structures, calls for careful examination of the variability and aging of the computer fabric. Time-zero and time-dependent phenomena need to be carefully considered so that the dependability of digital systems can be guaranteed. Already, architectures contain many mechanisms that detect and correct physically induced reliability violations. In many cases, guarantees on functional correctness come at a quantifiable performance cost. The current paper discusses the FP7-612069-HARPA project of the European Commission and its approach towards dependable performance. This project provides solutions for performance variability mitigation, under the run time presence of fabric variability/aging and built-in reliability, availability and serviceability (RAS) techniques. In this paper, we briefly present and discuss modeling and mitigation techniques developed within HARPA, covering many abstractions of digital system design: from the transistor to the application layer.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    IN - Informatics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    R - Projekt Ramcoveho programu EK

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings - 2015 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation, SAMOS 2015

  • ISBN

    978-1-4673-7311-1

  • ISSN

  • e-ISSN

  • Number of pages

    8

  • Pages from-to

    270-277

  • Publisher name

    Institute of Electrical and Electronics Engineers

  • Place of publication

    New York

  • Event location

    Samos

  • Event date

    Jul 20, 2015

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000380507900036