Magneto-optical ellipsometry of systems containing thick layers

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F04%3A00011074" target="_blank" >RIV/61989100:27350/04:00011074 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Magneto-optical ellipsometry of systems containing thick layers
Original language description
A recurrent matrix method for description and modeling of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick magnetooptic (MO) layers is proposed. Light interference in thin MO film is described by an amplitude-based Jones matrix formalism. For description of intensity summation in thick MO layers we propose using 4x4 coherence transforming matrices relating coherence vectors. The MO ellipsometry angles rotation and ellipticity are expressed in terms of the matrix components. Effects of partial coherence to reflection and transmission ellipsometry are discussed. Simplification of the general formalism is presented for the normal incidence polar MO geometry
Czech name
Magneto-optická ellipsometrie systémů obsahujících tlusté vrstvy
Czech description
Magneto-optická ellipsometrie systémů obsahujících tlusté vrstvy

Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
—

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)