Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27350%2F05%3A00013336" target="_blank" >RIV/61989100:27350/05:00013336 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry
Original language description
A phase-locked loop method is applied in processing the spectral interferograms resolved in a narrow spectral range in a dispersive Michelson interferometer including optical elements. The unwrapped spectral fringe phases with 2? ambiguity are determinedand a simple procedure in removing the ambiguity is applied to obtain the effective thicknesses of the optical elements knowing their dispersion. The effective thicknesses determined in two cases are compared with those obtained by measuring the equalization wavelengths. A Fourier transform method is applied in processing the spectral interferogram resolved over a wide spectral range in a slightly dispersive Michelson interferometer including a cube beamsplitter. The ambiguous spectral fringe phase isdetermined and a procedure in removing its ambiguity is applied to obtain the effective thickness of the beamsplitter.
Czech name
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Czech description
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Project
<a href="/en/project/GA202%2F03%2F0776" target="_blank" >GA202/03/0776: Magneto-optical effects in magnetic nanostructures</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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